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Textbooks Authored by "Michael Postek" (14 items)   Advanced search
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cover of Critical Issues in Scanning Electron Microscope Metrology : September-October 1994

by Michael T. Postek

Cover Type: Paperback
ISBN13: 978-0788115523
ISBN10: 0788115529

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cover of Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

by Michael Postek


ISBN13: 978-0819486103
ISBN10: 0819486108

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cover of Integrated Circuit Metrology, Inspection, and Process Control VII

by Michael T. Postek


ISBN13: 978-0819411600
ISBN10: 0819411604

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cover of Microlithography and Metrology in Micromachining II

by Michael T. Postek


ISBN13: 978-0819422781
ISBN10: 0819422789

cover of Instrumentation, Metrology, and Standards for Nanomanufacturing II: 10 August 2008, San Diego, California, USA

by Michael T. Postek


ISBN13: 978-0819472625
ISBN10: 081947262X

cover of Scanning Microscopy 2009: 4-7 May 2009, Monterey, California, United States

by Michael T. Postek


ISBN13: 978-0819476548
ISBN10: 0819476544

cover of Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

by Michael T. Postek


ISBN13: 978-0819490568
ISBN10: 0819490563

cover of Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V

by Michael Postek


ISBN13: 978-0819487155
ISBN10: 0819487155

cover of Microlithography and Metrology in Micromachining

by Michael T. Postek


ISBN13: 978-0819420060
ISBN10: 0819420069

cover of Instrumentation, Metrology, and Standards for Nanomanufacturing: 29-30 August 2007, San Diego, California, USA

by Michael T. Postek


ISBN13: 978-0819467966
ISBN10: 0819467960

cover of Instrumentation, Metrology, and Standards for Nanomanufacturing III: 3-5 August 2009, San Diego, California, United States

by Michael T. Postek


ISBN13: 978-0819476951
ISBN10: 0819476951

cover of Scanning Microscopy 2010: 17-19 May 2010, Monterey, California, United States

by Michael T. Postek


ISBN13: 978-0819482174
ISBN10: 081948217X

cover of Instrumentation, Metrology, and Standards for Nanomanufacturing IV: 2-4 August 2010, San Diego, California, United States

by Michael T. Postek


ISBN13: 978-0819482631
ISBN10: 0819482633

cover of Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI

by Michael T. Postek


ISBN13: 978-0819491831
ISBN10: 0819491837

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