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Failure Mechanisms in Semiconductor Devices

Failure Mechanisms in Semiconductor Devices - 2nd edition

ISBN13: 978-0471954828

Cover of Failure Mechanisms in Semiconductor Devices 2ND 97 (ISBN 978-0471954828)
ISBN13: 978-0471954828
ISBN10: 0471954829
Edition: 2ND 97
Copyright: 1997
Publisher: John Wiley & Sons, Inc.
Published: 1997
International: No

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Failure Mechanisms in Semiconductor Devices - 2ND 97 edition

ISBN13: 978-0471954828

A. Amerasekera

ISBN13: 978-0471954828
ISBN10: 0471954829
Edition: 2ND 97
Copyright: 1997
Publisher: John Wiley & Sons, Inc.
Published: 1997
International: No
Summary

This book focuses on the failure mechanisms of semiconductor devices--a topic of major importance and concern to electronic equipment manufacturers.

Table of Contents

Reliability Mathematics.

Principal Failure Mechanisms.

Failure Mechanisms in Technologies and Circuits.

Reliability Testing.

Reliability Prediction.

Screening.

Failure Analysis.

Quality Assurance.


Appendix
Indexes

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