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Introduction to X-Ray Powder Diffractometry

Introduction to X-Ray Powder Diffractometry - 96 edition

ISBN13: 978-0471513391

Cover of Introduction to X-Ray Powder Diffractometry 96 (ISBN 978-0471513391)
ISBN13: 978-0471513391
ISBN10: 0471513393
Cover type:
Edition/Copyright: 96
Publisher: John Wiley & Sons, Inc.
Published: 1996
International: No

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Introduction to X-Ray Powder Diffractometry - 96 edition

ISBN13: 978-0471513391

Ron Jenkins and Robert L. Snyder

ISBN13: 978-0471513391
ISBN10: 0471513393
Cover type:
Edition/Copyright: 96
Publisher: John Wiley & Sons, Inc.

Published: 1996
International: No
Summary

publications. Solid materials leave distinct patterns similar to fingerprints if they are X-rayed. X-ray powder diffractometry is an established technique used to "fingerprint" and identify samples such as moon rocks or pharmaceutical ingredients. This book provides an up-to-date, thorough introduction to the field, with clear, concise descriptions of both theory and practice.

Author Bio

Jenkins, Ron :

Ron Jenkins is General Manager at the International Centre for Diffraction Data in Newtown Square, Pennsylvania. He has been involved in X-ray research for over thirty years and has received several professional awards. Dr. Jenkins is the author of X-ray Fluorescence Spectrometry, An Introduction to X-ray Spectrometry, and six other books, as well as numerous papers and audio courses. He also wrote the section on X-ray technology in Kirk-Othmer Encyclo-pedia of Chemical Technology.


Snyder, Robert L. : Alfred University

Robert L. Snyder is Professor of Ceramic Science at New York State College of Ceramics at Alfred University, and Director of the university's Institute for Ceramic Superconduc-tivity. A Fellow of the American Ceramic Society, Professor Snyder is the author of two previous books and more than 200 published papers. He is active in numerous professional organizations and speaks frequently at conferences.

Table of Contents

Characteristics of X-Radiation.

The Crystalline State.

Diffraction Theory.

Sources for the Generation of X-Radiation.

Detectors and Detection Electronics.

Production of Monochromatic Radiation.

Instruments for the Measurement of Powder Patterns.

Alignment and Maintenance of Powder Diffractometers.

Specimen Preparation.

Acquisition of Diffraction Data.

Reduction of Data from Automated Powder Diffractometers.

Qualitative Analysis.

Quantitative Analysis.

Appendices.
Index.

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