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Semiconductor Material and Device Characterization - 3rd edition

Semiconductor Material and Device Characterization (ISBN10: 0471739065; ISBN13: 9780471739067)
ISBN13: 978-0471739067
ISBN10: 0471739065

Summary: Semiconductor Material and Device Characterizationis the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques.

In the third edition, Professor Schroder has rewritten parts of each chapter and a
dded two new chapters (Charge Based Measurements and Failure Analysis and Reliability), redrawn and updated most figures, and included new problems and approximately 100 new references.
  • New end of chapter problems
  • Outdated figures have been redone and replaced with current data
  • Up-to-date bibliography with over 1400 references
  • Professor Schroder is recognized as the authority in the field of semiconductor characterization
...show more
Summary: Semiconductor Material and Device Characterizationis the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques.

In the third edition, Professor Schroder has rewritten parts of each chapter and added two new chapters (Charge Based Measurements and Failure Analysis and Reliability), redrawn and updated most figures, and included new problems and approximately 100 new references.
  • New end of chapter problems
  • Outdated figures have been redone and replaced with current data
  • Up-to-date bibliography with over 1400 references
  • Professor Schroder is recognized as the authority in the field of semiconductor characterization
...show less

Edition/Copyright: 3RD 06
Cover:
Publisher: John Wiley & Sons, Inc.
Year Published: 2006
International: No

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